Publications of S. W. Hell

Klar, T. A.; Jakobs, S.; Dyba, M.; Egner, A.; Hell, S. W.: Fluorescence microscopy with diffraction resolution limit broken by stimulated emission. Proceedings of the National Academy of Sciences USA 97, pp. 8206 - 8210 (2000)

Schmidt, M.; Nagorni, M.; Hell, S. W.: Subresolution axial distance measurements in far-field fluorescence microscopy with precision of 1 nanometer. Review of Scientific Instruments 71, pp. 2742 - 2745 (2000)

Schoenle, A.; Glatz, M.; Hell, S. W.: Four-dimensional multiphoton microscopy with time-correlated single-photon counting. Applied Optics 39, pp. 6306 - 6311 (2000)

Egner, A.; Hell, S. W.: Equivalence of the Huygens-Fresnel and Debye approach for the calculation of high aperture point-spread-functions in the presence of refractive index mismatch. Journal of Microscopy 193, pp. 244 - 249 (1999)

Koester, H. J.; Baur, D.; Uhl, R.; Hell, S. W.: Ca²⁺ Fluorescence Imaging with Pico-and Femtosecond Two-Photon Excitation: Signal and Photodamage. Biophysical Journal 77, pp. 2226 - 2236 (1999)

Schoenle, A.; Haenninen, P. E.; Hell, S. W.: Nonlinear fluorescence through intermolecular energy transfer and resolution increase in fluorescence microscopy. Annalen der Physik 8, pp. 115 - 133 (1999)

Schoenle, A.; Hell, S. W.: Far-field fluorescence microscopy with repetitive excitation. European Physical Journal D 6, pp. 283 - 290 (1999)

Bewersdorf, J.; Pick, R.; Hell, S. W.: Multifocal Multiphoton Microscopy. Optics Letters 23, pp. 655 - 657 (1998)

Booth, M.; Hell, S. W.: Continuous wave excitation two-photon fluorescence microscopy exemplified with the 647 nm ArKr laser line. Journal of Microscopy 190, pp. 298 - 304 (1998)

Egner, A.; Schrader, M.; Hell, S. W.: Refractive index mismatch induced intensity and phase variations in fluorescence confocal, multiphoton and 4Pi-microscopy. Optics Communications 153, pp. 211 - 217 (1998)

Hell, S. W.; Booth, M.; Wilms, S.; Schnetter, C.; Kirsch, A. K.; Arndt-Jovin, D. J.; Jovin, T. M.: Two-photon near and far-field fluorescence microscopy with continuous-wave excitation. Optics Letters 23, pp. 1238 - 1240 (1998)

Hell, S. W.; Nagorni, M.: 4Pi-confocal microscopy with alternate interference. Optics Letters 23, pp. 1567 - 1569 (1998)

Nagorni, M.; Hell, S. W.: 4Pi-Confocal microscopy provides three-dimensional images of the microtubule network with 100- to 150-nm resolution. Journal of Structural Biology 123, pp. 236 - 247 (1998)

Schoenle, A.; Hell, S. W.: Heating by absorption in the focus of an objective lens. Optics Letters 23, pp. 325 - 327 (1998)

Schrader, M.; Bahlmann, K.; Giese, G.; Hell, S. W.: 4Pi-Confocal imaging in fixed biological specimens. Biophysical Journal 75, pp. 1659 - 1668 (1998)

Schrader, M.; Hell, S. W.; vanderVoort, H. T. M.: Three-dimensional superresolution with a 4Pi-confocal microscope using image restoration. Journal of Applied Physics 84, pp. 4033 - 4042 (1998)

Schrader, M.; Hofmann, U. G.; Hell, S. W.: Ultrathin fluorescent layers for monitoring the axial resolution in confocal and two-photon fluorescence microscopy. Journal of Microscopy 191, pp. 135 - 140 (1998)

Straub, M.; Hell, S. W.: Multifocal Multiphoton Microscopy: a fast and efficient tool for 3D-fluorescence imaging. Bioimaging 6, pp. 177 - 185 (1998)

Straub, M.; Hell, S. W.: Fluorescence lifetime 3D-microscopy with picosecond precision using a multifocal multiphoton microscope. Applied Physics Letters 73, pp. 1769 - 1771 (1998)

Soini, J. T.; Schrader, M.; Haenninen, P. E.; Hell, S. W.: Image formation and data acquisition in a stage scanning 4Pi confocal fluorescence microscope. Applied Optics 36 (34), pp. 8929 - 8934 (1997)